National Instruments Corporation 868118-03C

NI VEHICLE RADAR, 3 ANGLE BISTATIC 76 TO 81 GHZ MMWAVE TRX VARIABLE DELAY GEN,...

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National Instruments Corporation 868118-04C

NI VEHICLE RADAR, 3 ANGLE MONOSTATIC 76 TO 81 GHZ MMWAVE TRX VARIABLE DELAY...

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National Instruments Corporation 866046-01

NI STS T4M2 DX RF IOT A

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National Instruments Corporation 866061-01

NI BATTERY TESTER SYSTEM

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National Instruments Corporation 866077-01

STS T4 TEST SYSTEM

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National Instruments Corporation 788121-01

MMWAVE OTA VALIDATION ANECHOIC CHAMBER WITH EXTENDED TEMPERATURE RANGE

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National Instruments Corporation 789602-54211

NI PXIE-5842 VST, 54 GHZ, ANALYSIS AND GENERATION WITH MMWAVE CAPABILITIES...

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National Instruments Corporation 789602-26411

NI PXIE-5842 VST, 26.5 GHZ, 4 GHZ BANDWIDTH, ANALYSIS AND GENERATION

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National Instruments Corporation 875206-01

4 CHANNEL DIGITAL I/Q PLAYBACK AND RECORD BACKEND SUBSYSTEM

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National Instruments Corporation 875210-01

DYNAMIC HTGB FOR 120 CHANNELS, 200 DEGREE TEMPERATURE, GATE LEAKAGE...

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National Instruments Corporation 875223-01

CCS, VALEO - HIL VALIDATION TEST SYSTEM FOR ZONAL CONTROL - LEFT/DRIVER

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National Instruments Corporation 875221-01

CCS, VALEO - HIL VALIDATION TEST SYSTEM FOR ZONAL CONTROL - BACK

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National Instruments Corporation 875215-01

CCS, PCI/PIU SCREENING - SWITCHING SYSTEM AND INTEGRATION ENGINEERING...

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National Instruments Corporation 875220-01

DYN, H3TRB 80 WITH CLIMATE CHAMBER

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National Instruments Corporation 875220-02

DRB 80 CHANNELS

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National Instruments Corporation 875222-01

CCS, VALEO - HIL VALIDATION TEST SYSTEM FOR ZONAL CONTROL - FRONT

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National Instruments Corporation 866252-01

NI STS T4M2 DX FOR AWINIC V2

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National Instruments Corporation 866257-01

FEM_DUAL_RF16_SUB6

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National Instruments Corporation 875224-01

CCS, VALEO - HIL VALIDATION TEST SYSTEM FOR ZONAL CONTROL - PASSENGER

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National Instruments Corporation 865818-01

CATS STE RACK - JAGUAR

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National Instruments Corporation 875231-01

CCS, STLA GLOBAL HIL RFQ 1180119 - VTP HIL

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National Instruments Corporation 865862-02

CCS,NGC LSS LF - LEPS - REV 2

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National Instruments Corporation 865859-01

CCS,NGC LSS LF - ICG - REV 2

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National Instruments Corporation 865861-01

CCS,NGC LSS LF - ICPS RACK - REV 3

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National Instruments Corporation 868188-01

SYSTEM CONFIGURATION FOR HW VALIDATION OF A CAR COMPUTER - VARIANT A

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National Instruments Corporation 866467-01

NI STS T2 DX FOR CAPACITOR WAFER PROBING TESTER

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National Instruments Corporation 866469-01

NI STS T2M2 DX FOR OSAT GP3+

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National Instruments Corporation 866476-01

NI STS T4M2 DX FOR SEMCO FEM_DUAL_RF

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National Instruments Corporation 866488-01

NI STS T4M2 DX FOR ADI RFMW - 54GHZ

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National Instruments Corporation 866468-01

NI STS T2M2 DX for OSAT GP3

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National Instruments Corporation 865864-01

CCS,NGC LSS LF - LEPS - REV 2

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National Instruments Corporation 865866-01

CCS,NGC LSS LF - RTPS - REV 3

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National Instruments Corporation 868143-01

SPIRENT ONLY - 5G NR TEST GNB FOR FR1, PXIE-8881 AND 1095

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National Instruments Corporation 865862-03

CCS,NGC LSS LF - LEPS - REV 3

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National Instruments Corporation 866494-01

NI STS T4M2 DX FOR PSEMI QS4C-SM1

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National Instruments Corporation 866495-01

NI STS T4M2 DX FOR PSEMI DS2C-SM1

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National Instruments Corporation 866492-01

NI RF STS T4M2 DX FOR QORVO QS2C-SM1

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National Instruments Corporation 866493-01

NI STS T1M2 DX FOR 3PEAK BMS MS

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National Instruments Corporation 866494-02

NI STS T4M2 DX FOR PSEMI QS4C-SM1_FB

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National Instruments Corporation 865888-01

INTEL AIPEC V3 DESTACKED

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National Instruments Corporation 865886-01

JLR LOKI POC A AND B

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National Instruments Corporation 868170-03B

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 8 CH...

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National Instruments Corporation 868170-03C

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 8 CH...

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National Instruments Corporation 865897-01

CCS,NGC TIGER F22 RACK

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National Instruments Corporation 868170-03CN

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 8 CH CONFIG,...

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National Instruments Corporation 868170-04B

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 10 CH...

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National Instruments Corporation 868170-04C

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 10 CH...

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National Instruments Corporation 868170-04CN

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 10 CH CONFIG,...

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National Instruments Corporation 866137-01

NI STS T4M2 DX FEM_QUAL_RF

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National Instruments Corporation 866143-01

NI STS T4M2 DX for TMS High power

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